Several techniques have been used to analyze the potential of our DLC films.  AFM is used to look at the surface roughness and in general the film is as smooth as the substrate used.  Optical ellipsometry is used to see if the film is more graphitic or diamond like.  The most informative analysis is done with neutron reflectometry, which gives the density of the film as seen by neutron.  We need as dense of a film as possible.